Information card for entry 4001993
| Formula |
C16 H15 N4 O P |
| Calculated formula |
C16 H15 N4 O P |
| SMILES |
O=P(c1ccccc1)(Nc1cccnc1)Nc1cccnc1 |
| Title of publication |
Anion Driven [CuIIL2]nFrameworks: Crystal Structures, Guest-Encapsulation, Dielectric, and Possible Ferroelectric Properties |
| Authors of publication |
Srivastava, Anant Kumar; Praveenkumar, B.; Mahawar, Indra Kumar; Divya, Pillutla; Shalini, S.; Boomishankar, Ramamoorthy |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2014 |
| Journal volume |
26 |
| Journal issue |
12 |
| Pages of publication |
3811 |
| a |
10.3 ± 0.006 Å |
| b |
6.107 ± 0.004 Å |
| c |
22.774 ± 0.013 Å |
| α |
90° |
| β |
93.104 ± 0.012° |
| γ |
90° |
| Cell volume |
1430.4 ± 1.5 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1058 |
| Residual factor for significantly intense reflections |
0.0697 |
| Weighted residual factors for significantly intense reflections |
0.167 |
| Weighted residual factors for all reflections included in the refinement |
0.188 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.099 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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