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Information card for entry 4002182
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Coordinates | 4002182.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Nd8 O26 Si6 Sr2 |
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Calculated formula | Nd8 O26 Si6 Sr2 |
Title of publication | Crystal Chemical Analysis of Nd9.33Si6O26and Nd8Sr2Si6O26Apatite Electrolytes Using Aberration-Corrected Scanning Transmission Electron Microscopy and Impedance Spectroscopy |
Authors of publication | An, Tao; Baikie, Tom; Weyland, Matthew; Shin, J. Felix; Slater, Peter R.; Wei, Jun; White, Tim J. |
Journal of publication | Chemistry of Materials |
Year of publication | 2015 |
Journal volume | 27 |
Journal issue | 4 |
Pages of publication | 1217 |
a | 9.5475 ± 0.0003 Å |
b | 9.5475 ± 0.0003 Å |
c | 7.1019 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 560.64 ± 0.05 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.031 |
Residual factor for significantly intense reflections | 0.0304 |
Weighted residual factors for significantly intense reflections | 0.0477 |
Weighted residual factors for all reflections included in the refinement | 0.0479 |
Goodness-of-fit parameter for significantly intense reflections | 3.29 |
Goodness-of-fit parameter for all reflections included in the refinement | 3.29 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4002182.html
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