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Information card for entry 4002203
Preview
Coordinates | 4002203.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H20 S2 |
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Calculated formula | C24 H20 S2 |
SMILES | s1c2c3ccc(cc3sc2c2ccc(cc12)c1ccccc1)CCCC |
Title of publication | Effects of Substituted Alkyl Chain Length on Solution-Processable Layered Organic Semiconductor Crystals |
Authors of publication | Inoue, Satoru; Minemawari, Hiromi; Tsutsumi, Jun’ya; Chikamatsu, Masayuki; Yamada, Toshikazu; Horiuchi, Sachio; Tanaka, Mutsuo; Kumai, Reiji; Yoneya, Makoto; Hasegawa, Tatsuo |
Journal of publication | Chemistry of Materials |
Year of publication | 2015 |
Journal volume | 27 |
Journal issue | 11 |
Pages of publication | 3809 |
a | 8.357 ± 0.002 Å |
b | 5.95 ± 0.001 Å |
c | 19.356 ± 0.003 Å |
α | 90° |
β | 97.453 ± 0.005° |
γ | 90° |
Cell volume | 954.3 ± 0.3 Å3 |
Cell temperature | 300 K |
Ambient diffraction temperature | 300 K |
Number of distinct elements | 3 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0671 |
Residual factor for significantly intense reflections | 0.0486 |
Weighted residual factors for significantly intense reflections | 0.1001 |
Weighted residual factors for all reflections included in the refinement | 0.1148 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4002203.html
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