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Information card for entry 4002206
Preview
Coordinates | 4002206.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H24 S2 |
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Calculated formula | C26 H24 S2 |
SMILES | s1c2c3ccc(cc3sc2c2ccc(cc12)c1ccccc1)CCCCCC |
Title of publication | Effects of Substituted Alkyl Chain Length on Solution-Processable Layered Organic Semiconductor Crystals |
Authors of publication | Inoue, Satoru; Minemawari, Hiromi; Tsutsumi, Jun’ya; Chikamatsu, Masayuki; Yamada, Toshikazu; Horiuchi, Sachio; Tanaka, Mutsuo; Kumai, Reiji; Yoneya, Makoto; Hasegawa, Tatsuo |
Journal of publication | Chemistry of Materials |
Year of publication | 2015 |
Journal volume | 27 |
Journal issue | 11 |
Pages of publication | 3809 |
a | 6.0957 ± 0.0001 Å |
b | 7.8022 ± 0.0001 Å |
c | 44.243 ± 0.003 Å |
α | 90° |
β | 93.5107 ± 0.0007° |
γ | 90° |
Cell volume | 2100.24 ± 0.15 Å3 |
Cell temperature | 300 K |
Ambient diffraction temperature | 300 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.1177 |
Residual factor for significantly intense reflections | 0.0756 |
Weighted residual factors for significantly intense reflections | 0.2075 |
Weighted residual factors for all reflections included in the refinement | 0.2299 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.916 |
Diffraction radiation wavelength | 1.5527 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4002206.html
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