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Information card for entry 4002681
Preview
Coordinates | 4002681.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H56 Bi4 I12 N8 O8 |
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Calculated formula | C24 H56 Bi4 I12 N8 O8 |
SMILES | [Bi]12([I][Bi]([I]2)(I)(I)I)(I)([I][Bi]([I]1)(I)(I)I)I.[Bi]([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)([O]=CN(C)C)[O]=CN(C)C |
Title of publication | Solution-Processed BiI3Thin Films for Photovoltaic Applications: Improved Carrier Collection via Solvent Annealing |
Authors of publication | Hamdeh, Umar H.; Nelson, Rainie D.; Ryan, Bradley J.; Bhattacharjee, Ujjal; Petrich, Jacob W.; Panthani, Matthew G. |
Journal of publication | Chemistry of Materials |
Year of publication | 2016 |
Journal volume | 28 |
Journal issue | 18 |
Pages of publication | 6567 |
a | 15.1588 ± 0.001 Å |
b | 30.997 ± 0.002 Å |
c | 15.7999 ± 0.001 Å |
α | 90° |
β | 117.826 ± 0.001° |
γ | 90° |
Cell volume | 6565.6 ± 0.7 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0715 |
Residual factor for significantly intense reflections | 0.0406 |
Weighted residual factors for significantly intense reflections | 0.0858 |
Weighted residual factors for all reflections included in the refinement | 0.1045 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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