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Information card for entry 4003156
Preview
Coordinates | 4003156.cif |
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Original paper (by DOI) | HTML |
Formula | C16 H15 N4 O P |
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Calculated formula | C16 H15 N4 O P |
SMILES | P(=O)(Nc1ncccc1)(Nc1ncccc1)c1ccccc1 |
Title of publication | Potentially Ferroelectric {CuIIL2}n Based Two-Dimensional Framework Exhibiting High Polarization and Guest-Assisted Dielectric Anomaly |
Authors of publication | Srivastava, Anant Kumar; Divya, Pillutla; Praveenkumar, B.; Boomishankar, Ramamoorthy |
Journal of publication | Chemistry of Materials |
Year of publication | 2015 |
Journal volume | 27 |
Journal issue | 15 |
Pages of publication | 5222 |
a | 8.433 ± 0.003 Å |
b | 9.174 ± 0.004 Å |
c | 10.074 ± 0.004 Å |
α | 80.921 ± 0.007° |
β | 80.814 ± 0.007° |
γ | 89.836 ± 0.008° |
Cell volume | 759.5 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0426 |
Residual factor for significantly intense reflections | 0.0383 |
Weighted residual factors for significantly intense reflections | 0.1037 |
Weighted residual factors for all reflections included in the refinement | 0.1072 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4003156.html
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