Information card for entry 4003941
Formula |
O232 Si116 |
Calculated formula |
O232 Si116 |
Title of publication |
EMM-25: The Structure of Two-Dimensional 11 ×10 Medium-Pore Borosilicate Zeolite Unraveled Using 3D Electron Diffraction |
Authors of publication |
Cho, Jung; Yun, Yifeng; Xu, Hongyi; Sun, Junliang; Burton, Allen W.; Strohmaier, Karl G.; Terefenko, Gene; Vroman, Hilda; Afeworki, Mobae; Cao, Guang; Wang, Hao; Zou, Xiaodong; Willhammar, Tom |
Journal of publication |
Chemistry of Materials |
Year of publication |
2021 |
a |
11.055 ± 0.002 Å |
b |
22.912 ± 0.005 Å |
c |
24.914 ± 0.005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
6311 ± 2 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
2 |
Space group number |
63 |
Hermann-Mauguin space group symbol |
C m c m |
Hall space group symbol |
-C 2c 2 |
Residual factor for all reflections |
0.2133 |
Residual factor for significantly intense reflections |
0.1938 |
Weighted residual factors for significantly intense reflections |
0.4486 |
Weighted residual factors for all reflections included in the refinement |
0.4635 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.685 |
Diffraction radiation wavelength |
0.02508 Å |
Diffraction radiation type |
electron |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
No |
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