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Information card for entry 4021658
Preview
Coordinates | 4021658.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H36 O4 S Se Si |
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Calculated formula | C30 H36 O4 S Se Si |
SMILES | [Se](C[C@@H]1[C@@H]([C@@H]([Si](C)(C)c2ccccc2)[C@@H](C1)C(=O)OC)CS(=O)(=O)c1ccc(cc1)C)c1ccccc1.[Se](C[C@H]1[C@H]([C@H]([Si](C)(C)c2ccccc2)[C@H](C1)C(=O)OC)CS(=O)(=O)c1ccc(cc1)C)c1ccccc1 |
Title of publication | Radical-Mediated 5-Exo-Trig Cyclizations of 3-Silylhepta-1,6-dienes |
Authors of publication | Philippe James; Kurt Schenk; Yannick Landais |
Journal of publication | Journal of Organic Chemistry |
Year of publication | 2006 |
Journal volume | 71 |
Pages of publication | 3630 - 3633 |
a | 28.734 ± 0.005 Å |
b | 9.253 ± 0.005 Å |
c | 25.67 ± 0.005 Å |
α | 90 ± 0.005° |
β | 119.869 ± 0.005° |
γ | 90 ± 0.005° |
Cell volume | 5918 ± 4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1548 |
Residual factor for significantly intense reflections | 0.1419 |
Weighted residual factors for significantly intense reflections | 0.4052 |
Weighted residual factors for all reflections included in the refinement | 0.4093 |
Goodness-of-fit parameter for all reflections included in the refinement | 3.204 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4021658.html
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