Information card for entry 4022379

Structure parameters

• Formula: C32 H26 Cl2 N O10 S2
• Calculated formula: C32 H26 Cl2 N O10 S2
• SMILES: [S+]1(c2ccccc2Oc2ccccc12)[C@@H]1[C@@H]([S+]2c3ccccc3Oc3ccccc23)CCCC1.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].C(#N)C.[S+]1(c2ccccc2Oc2ccccc12)[C@H]1[C@H]([S+]2c3ccccc3Oc3ccccc23)CCCC1.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].C(#N)C
• Title of publication: Adducts of Phenoxathiin and Thianthrene Cation Radicals with Alkenes and Cycloalkenes
• Authors of publication: Henry J. Shine; Bingjun Zhao; Ding-Quan Qian; John N. Marx; Ilse Y. Guzmán-Jiménez; John H. Thurston; T. Ould-Ely; Kenton H. Whitmire
• Journal of publication: Journal of Organic Chemistry
• Year of publication: 2003
• Journal volume: 68
• Pages of publication: 8910 - 8917
• a: 9.0344 ± 0.0018 Å
• b: 16.368 ± 0.003 Å
• c: 21.868 ± 0.004 Å
• α: 90°
• β: 100.84 ± 0.03°
• γ: 90°
• Cell volume: 3176 ± 1.1 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0951
• Residual factor for significantly intense reflections: 0.0512
• Weighted residual factors for significantly intense reflections: 0.151
• Weighted residual factors for all reflections included in the refinement: 0.1931
• Goodness-of-fit parameter for all reflections included in the refinement: 0.788
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No