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Information card for entry 4023766
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Coordinates | 4023766.cif |
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Original paper (by DOI) | HTML |
Common name | T2O2-O2T2 |
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Chemical name | 2,2'-bithieno[3,2-b]thiophene 1,1,1',1'-tetraoxide |
Formula | C12 H6 O4 S4 |
Calculated formula | C12 H6 O4 S4 |
SMILES | c1cc2c(C=C(S2(=O)=O)C2=Cc3c(ccs3)S2(=O)=O)s1 |
Title of publication | Regiochemical Effects of Sulfur Oxidation on the Electronic and Solid-State Properties of Planarized Oligothiophenes Containing Thieno[3,2-b]thiophene Units |
Authors of publication | Lidaris San Miguel; Adam J. Matzger |
Journal of publication | Journal of Organic Chemistry |
Year of publication | 2008 |
Journal volume | 73 |
Pages of publication | 7882 - 7888 |
a | 6.09905 ± 0.00015 Å |
b | 16.4375 ± 0.0006 Å |
c | 6.54633 ± 0.00018 Å |
α | 90° |
β | 102.879 ± 0.002° |
γ | 90° |
Cell volume | 639.78 ± 0.03 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.0349 |
Residual factor for significantly intense reflections | 0.0333 |
Weighted residual factors for significantly intense reflections | 0.0809 |
Weighted residual factors for all reflections included in the refinement | 0.0819 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation wavelength | 1.54187 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4023766.html
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