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Information card for entry 4024524
Preview
| Coordinates | 4024524.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H21 N3 O2 S |
|---|---|
| Calculated formula | C25 H21 N3 O2 S |
| SMILES | S=C1N([C@@H]2N(c3ccccc3)CCN2C(=O)[C@H]1c1ccccc1)c1ccc(OC)cc1.S=C1N([C@H]2N(c3ccccc3)CCN2C(=O)[C@@H]1c1ccccc1)c1ccc(OC)cc1 |
| Title of publication | Thionation of Mesoionics with Isothiocyanates: Evidence Supporting a Four-Step Domino Process and Ruling Out a [2 + 2] Mechanism |
| Authors of publication | David Cantillo; Martín Ávalos; Reyes Babiano; Pedro Cintas; José L. Jiménez; Mark E. Light; Juan C. Palacios |
| Journal of publication | Journal of Organic Chemistry |
| Year of publication | 2009 |
| Journal volume | 74 |
| Pages of publication | 3698 - 3705 |
| a | 13.5187 ± 0.0003 Å |
| b | 7.0193 ± 0.0002 Å |
| c | 22.355 ± 0.0006 Å |
| α | 90° |
| β | 91.322 ± 0.002° |
| γ | 90° |
| Cell volume | 2120.74 ± 0.1 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0926 |
| Residual factor for significantly intense reflections | 0.0529 |
| Weighted residual factors for significantly intense reflections | 0.1162 |
| Weighted residual factors for all reflections included in the refinement | 0.1344 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4024524.html
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Users of the data should acknowledge the original authors of the
structural data.