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Information card for entry 4024973
Preview
Coordinates | 4024973.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H23 K N2 O6 Si |
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Calculated formula | C28 H23 K N2 O6 Si |
SMILES | [K+].[Si]12(Oc3c(O1)cccc3)(Oc1c(O2)cccc1)C1=CC[C@H]2[C@@H](C1)C(=O)N(C2=O)c1ccccc1.N#CC.[K+].[Si]12(Oc3c(O1)cccc3)(Oc1c(O2)cccc1)C1=CC[C@@H]2[C@H](C1)C(=O)N(C2=O)c1ccccc1.N#CC |
Title of publication | Preparation of 2-Silicon-Substituted 1,3-Dienes and Their Diels-Alder/Cross-Coupling Reactions |
Authors of publication | Ramakrishna R. Pidaparthi; Christopher S. Junker; Mark E. Welker; Cynthia S. Day; Marcus W. Wright |
Journal of publication | Journal of Organic Chemistry |
Year of publication | 2009 |
Journal volume | 74 |
Pages of publication | 8290 - 8297 |
a | 10.141 ± 0.008 Å |
b | 12.072 ± 0.01 Å |
c | 21.29 ± 0.014 Å |
α | 90° |
β | 95.56 ± 0.02° |
γ | 90° |
Cell volume | 2594 ± 3 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1146 |
Residual factor for significantly intense reflections | 0.0749 |
Weighted residual factors for significantly intense reflections | 0.1407 |
Weighted residual factors for all reflections included in the refinement | 0.157 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4024973.html
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