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Information card for entry 4027908
Preview
| Coordinates | 4027908.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H56 N4 Si2 |
|---|---|
| Calculated formula | C48 H56 N4 Si2 |
| SMILES | [Si](C#Cc1c2c(c(C#C[Si](C(C)C)(C(C)C)C(C)C)c3c1cc1ccccc1c3)Nc1[n]c3cc4ccccc4cc3[n]c1N2)(C(C)C)(C(C)C)C(C)C |
| Title of publication | Reactions of Large Tetraaza-N,N'-dihydroacenes: Formation of Unexpected Adducts and an Unstable Tetraazahexacene |
| Authors of publication | Jens U. Engelhart; Benjamin D. Lindner; Olena Tverskoy; Manuel Schaffroth; Frank Rominger; Uwe H. F. Bunz |
| Journal of publication | Journal of Organic Chemistry |
| Year of publication | 2013 |
| Journal volume | 78 |
| Pages of publication | 1249 - 1253 |
| a | 7.8787 ± 0.0001 Å |
| b | 12.8918 ± 0.0001 Å |
| c | 21.5552 ± 0.0002 Å |
| α | 93.602 ± 0.001° |
| β | 94.672 ± 0.001° |
| γ | 95.417 ± 0.001° |
| Cell volume | 2166.86 ± 0.04 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.107 |
| Residual factor for significantly intense reflections | 0.0607 |
| Weighted residual factors for significantly intense reflections | 0.1424 |
| Weighted residual factors for all reflections included in the refinement | 0.1668 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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