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Information card for entry 4028295
Preview
| Coordinates | 4028295.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 2,3-Dihexyloxy-5,7-bis(2-thienyl)thieno[3,4-b]pyrazine |
|---|---|
| Formula | C26 H32 N2 O2 S3 |
| Calculated formula | C26 H32 N2 O2 S2.9255 |
| SMILES | s1c(c2nc(OCCCCCC)c(OCCCCCC)nc2c1c1sccc1)c1sccc1 |
| Title of publication | Synthesis and Characterization of Thieno[3,4-b]pyrazine-Based Terthienyls: Tunable Precursors for Low Band Gap Conjugated Materials |
| Authors of publication | Ryan L. Schwiderski; Seth C. Rasmussen |
| Journal of publication | Journal of Organic Chemistry |
| Year of publication | 2013 |
| Journal volume | 78 |
| Pages of publication | 5453 - 5462 |
| a | 13.7138 ± 0.0004 Å |
| b | 5.5493 ± 0.0002 Å |
| c | 33.3099 ± 0.001 Å |
| α | 90° |
| β | 94.945 ± 0.002° |
| γ | 90° |
| Cell volume | 2525.51 ± 0.14 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0404 |
| Residual factor for significantly intense reflections | 0.0324 |
| Weighted residual factors for significantly intense reflections | 0.084 |
| Weighted residual factors for all reflections included in the refinement | 0.0892 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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