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Information card for entry 4028892
Preview
Coordinates | 4028892.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H36 B2 F8 N2 S4 |
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Calculated formula | C36 H36 B2 F8 N2 S4 |
SMILES | [B](F)(F)(F)[F-].c1ccc2[S+](c3ccccc3Sc2c1)/C(=C([S+]1c2ccccc2Sc2ccccc12)\CCC)CCC.N#CC.[B](F)(F)(F)[F-].N#CC |
Title of publication | Adducts of Thianthrene- and Phenoxathiin Cation Radical Salts with Symmetrical Alkynes. Structure and Formation of Cumulenes on Alumina Leading to α-Diketones, α-Hydroxyalkynes, and α-Acetamidoalkynes |
Authors of publication | Shine, Henry J.; Rangappa, Paramashivappa; Marx, John N.; Shelly, Dennis C.; Ould-Ely, Teyeb; Whitmire, Kenton H. |
Journal of publication | The Journal of Organic Chemistry |
Year of publication | 2005 |
Journal volume | 70 |
Journal issue | 10 |
Pages of publication | 3877 - 3883 |
a | 9.6373 ± 0.0016 Å |
b | 18.901 ± 0.003 Å |
c | 11.2859 ± 0.0018 Å |
α | 90° |
β | 109.531 ± 0.003° |
γ | 90° |
Cell volume | 1937.5 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.157 |
Residual factor for significantly intense reflections | 0.0878 |
Weighted residual factors for significantly intense reflections | 0.2134 |
Weighted residual factors for all reflections included in the refinement | 0.2444 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.201 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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