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Information card for entry 4030223
Preview
Coordinates | 4030223.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H22 N2 O4 |
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Calculated formula | C20 H22 N2 O4 |
SMILES | C1C[C@@H]2[C@H]3[C@@H](CC=C2C2=CC[C@@H]4[C@H]([C@@H]12)C(=O)N(C4=O)C)C(=O)N(C3=O)C.C1C[C@H]2[C@@H]3[C@H](CC=C2C2=CC[C@H]4[C@@H]([C@H]12)C(=O)N(C4=O)C)C(=O)N(C3=O)C |
Title of publication | Computational and synthetic studies with tetravinylethylenes. |
Authors of publication | Lindeboom, Erik J.; Willis, Anthony C.; Paddon-Row, Michael N; Sherburn, Michael S. |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2014 |
Journal volume | 79 |
Journal issue | 23 |
Pages of publication | 11496 - 11507 |
a | 22.0688 ± 0.0004 Å |
b | 6.4813 ± 0.0001 Å |
c | 25.2718 ± 0.0005 Å |
α | 90° |
β | 104.499 ± 0.0008° |
γ | 90° |
Cell volume | 3499.62 ± 0.11 Å3 |
Cell temperature | 200 K |
Ambient diffraction temperature | 200 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.045 |
Residual factor for significantly intense reflections | 0.0377 |
Weighted residual factors for all reflections | 0.1 |
Weighted residual factors for significantly intense reflections | 0.0952 |
Weighted residual factors for all reflections included in the refinement | 0.1 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9978 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4030223.html
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Users of the data should acknowledge the original authors of the
structural data.