Information card for entry 4030230

Structure parameters

• Formula: C22 H44 Si4
• Calculated formula: C22 H44 Si4
• SMILES: C(=C\C(=C(/C=C/[Si](C)(C)C)\C=C\[Si](C)(C)C)\C=C\[Si](C)(C)C)/[Si](C)(C)C
• Title of publication: Computational and synthetic studies with tetravinylethylenes.
• Authors of publication: Lindeboom, Erik J.; Willis, Anthony C.; Paddon-Row, Michael N; Sherburn, Michael S.
• Journal of publication: The Journal of organic chemistry
• Year of publication: 2014
• Journal volume: 79
• Journal issue: 23
• Pages of publication: 11496 - 11507
• a: 18.4241 ± 0.0007 Å
• b: 12.7737 ± 0.0005 Å
• c: 20.9954 ± 0.0005 Å
• α: 90°
• β: 113.385 ± 0.002°
• γ: 90°
• Cell volume: 4535.3 ± 0.3 ų
• Cell temperature: 200 K
• Ambient diffraction temperature: 200 K
• Number of distinct elements: 3
• Space group number: 4
• Hermann-Mauguin space group symbol: P 1 21 1
• Hall space group symbol: P 2yb
• Residual factor for all reflections: 0.1332
• Residual factor for significantly intense reflections: 0.0914
• Weighted residual factors for all reflections: 0.2986
• Weighted residual factors for significantly intense reflections: 0.239
• Weighted residual factors for all reflections included in the refinement: 0.2986
• Goodness-of-fit parameter for all reflections included in the refinement: 0.9832
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No