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Information card for entry 4030301
Preview
Coordinates | 4030301.cif |
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Original paper (by DOI) | HTML |
Formula | C34 H48 N2 Si2 |
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Calculated formula | C34 H48 N2 Si2 |
SMILES | c12ccccc1nc1c(ccc(c1n2)C#C[Si](C(C)C)(C(C)C)C(C)C)C#C[Si](C(C)C)(C(C)C)C(C)C |
Title of publication | Soluble Diazaiptycenes: Materials for Solution-Processed Organic Electronics. |
Authors of publication | Biegger, Philipp; Stolz, Sebastian; Intorp, Sebastian N.; Zhang, Yexiang; Engelhart, Jens U.; Rominger, Frank; Hardcastle, Kenneth I.; Lemmer, Uli; Qian, Xuhong; Hamburger, Manuel; Bunz, U. H. F. |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2014 |
Journal volume | 80 |
Journal issue | 1 |
Pages of publication | 582 |
a | 7.5797 ± 0.0017 Å |
b | 17.349 ± 0.003 Å |
c | 26.474 ± 0.004 Å |
α | 103.24 ± 0.015° |
β | 98.052 ± 0.015° |
γ | 93.741 ± 0.015° |
Cell volume | 3338.2 ± 1.1 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2515 |
Residual factor for significantly intense reflections | 0.093 |
Weighted residual factors for significantly intense reflections | 0.162 |
Weighted residual factors for all reflections included in the refinement | 0.2187 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4030301.html
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