Information card for entry 4030446

Structure parameters

• Formula: C14 H36 N2 Si2 Te
• Calculated formula: C14 N2 Si2 Te
• SMILES: [Te](N([Si](C)(C)C)C(C)(C)C)N([Si](C)(C)C)C(C)(C)C
• Title of publication: Preparation and structure characterization of the bis[tertbutyl(trimethylsilyl)amino]chalcogenides of selenium and tellurium
• Authors of publication: Bjorgvinsson, M.; Roesky, H.W.; Pauer, F.; Stalke, D.; Sheldrick, G.M.
• Journal of publication: European Journal of Solid State and Inorganic Chemistry
• Year of publication: 1992
• Journal volume: 29
• Pages of publication: 759 - 776
• a: 13.161 ± 0.003 Å
• b: 10.56 ± 0.003 Å
• c: 15.961 ± 0.003 Å
• α: 90°
• β: 111.89 ± 0.01°
• γ: 90°
• Cell volume: 2058.3 ± 0.9 ų
• Ambient diffraction temperature: 153 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for significantly intense reflections: 0.0205
• Weighted residual factors for significantly intense reflections: 0.0209
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No