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Information card for entry 4031703
Preview
Coordinates | 4031703.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H34 O9 |
---|---|
Calculated formula | C28 H34 O9 |
SMILES | O=C(c1c2OC([C@H]3[C@@H](c2c(O)c(c1O)C)Oc1c2c(OC(C[C@H]32)(C)C)c(c(O)c1C)C(=O)C)(C)C)C.O.O=C(c1c2OC([C@@H]3[C@H](c2c(O)c(c1O)C)Oc1c2c(OC(C[C@@H]32)(C)C)c(c(O)c1C)C(=O)C)(C)C)C.O |
Title of publication | The Mosaic of Rottlerin. |
Authors of publication | Hong, Kenneth K. C.; Ball, Graham E.; Black, David StC; Kumar, Naresh |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2015 |
Journal volume | 80 |
Journal issue | 21 |
Pages of publication | 10668 - 10674 |
a | 16.4146 ± 0.001 Å |
b | 7.1564 ± 0.0005 Å |
c | 21.2383 ± 0.0013 Å |
α | 90° |
β | 102.908 ± 0.003° |
γ | 90° |
Cell volume | 2431.8 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150.02 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.06 |
Residual factor for significantly intense reflections | 0.0443 |
Weighted residual factors for significantly intense reflections | 0.1192 |
Weighted residual factors for all reflections included in the refinement | 0.1317 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4031703.html
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Users of the data should acknowledge the original authors of the
structural data.