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Information card for entry 4032640
Preview
Coordinates | 4032640.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H96 N4 O4 S Si4 |
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Calculated formula | C54 H96 N4 O4 S Si4 |
SMILES | s1c(ccc1c1ccc(cc1)C1N(C(C(N1O[Si](C)(C)C(C)(C)C)(C)C)(C)C)O[Si](C)(C)C(C)(C)C)c1ccc(cc1)C1N(C(C(N1O[Si](C)(C)C(C)(C)C)(C)C)(C)C)O[Si](C)(C)C(C)(C)C |
Title of publication | Mixed Phenyl and Thiophene Oligomers for Bridging Nitronyl Nitroxides. |
Authors of publication | Kolanji, Kubandiran; Ravat, Prince; Bogomyakov, Artem S.; Ovcharenko, Victor I.; Schollmeyer, Dieter; Baumgarten, Martin |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2017 |
a | 7.3684 ± 0.0008 Å |
b | 10.964 ± 0.0011 Å |
c | 40.733 ± 0.004 Å |
α | 84.629 ± 0.002° |
β | 88.353 ± 0.003° |
γ | 73.129 ± 0.003° |
Cell volume | 3135.2 ± 0.6 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.13 |
Residual factor for significantly intense reflections | 0.0753 |
Weighted residual factors for significantly intense reflections | 0.1642 |
Weighted residual factors for all reflections included in the refinement | 0.1891 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4032640.html
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