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Information card for entry 4032975
Preview
Coordinates | 4032975.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H32 O4 Si |
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Calculated formula | C24 H32 O4 Si |
SMILES | CC(C)[Si](C(C)C)(C(C)C)O[C@H]1CC(=C)C[C@]23[C@]1(C(=O)c1ccccc1C2=O)O3.CC(C)[Si](C(C)C)(C(C)C)O[C@@H]1CC(=C)C[C@@]23[C@@]1(C(=O)c1ccccc1C2=O)O3 |
Title of publication | Applications of [4+2] Anionic Annulation and Carbonyl-Ene Reaction in the Synthesis of Anthraquinones, Tetrahydroanthraquinones, and Pyranonaphthoquinones. |
Authors of publication | Basak, Shyam; Mal, Dipakranjan |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2017 |
Journal volume | 82 |
Journal issue | 20 |
Pages of publication | 11035 - 11051 |
a | 16.5149 ± 0.0011 Å |
b | 14.6947 ± 0.001 Å |
c | 9.2256 ± 0.0006 Å |
α | 90° |
β | 97.975 ± 0.002° |
γ | 90° |
Cell volume | 2217.2 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0757 |
Residual factor for significantly intense reflections | 0.0597 |
Weighted residual factors for significantly intense reflections | 0.1648 |
Weighted residual factors for all reflections included in the refinement | 0.1822 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4032975.html
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