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Information card for entry 4033992
Preview
Coordinates | 4033992.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H34 O4 Si |
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Calculated formula | C21 H34 O4 Si |
SMILES | [Si](OC[C@]12[C@H]3C(=O)[C@@H]([C@H]([C@@]13CC=C)C[C@@H]2C(=O)OC)C)(C)(C)C(C)(C)C.[Si](OC[C@@]12[C@@H]3C(=O)[C@H]([C@@H]([C@]13CC=C)C[C@H]2C(=O)OC)C)(C)(C)C(C)(C)C |
Title of publication | Formal Synthesis of (±)-Pentalenolactone A Methyl Ester. |
Authors of publication | Niu, Guang-Hao; Liu, Pin-Heng; Hung, Wei-Chun; Tseng, Ping-Yao; Chuang, Gary Jing |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2019 |
Journal volume | 84 |
Journal issue | 16 |
Pages of publication | 10172 - 10182 |
a | 11.8826 ± 0.0002 Å |
b | 14.0278 ± 0.0002 Å |
c | 14.7882 ± 0.0003 Å |
α | 67.8036 ± 0.0008° |
β | 70.5153 ± 0.0008° |
γ | 77.3415 ± 0.001° |
Cell volume | 2139.34 ± 0.07 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0683 |
Residual factor for significantly intense reflections | 0.0463 |
Weighted residual factors for significantly intense reflections | 0.1125 |
Weighted residual factors for all reflections included in the refinement | 0.1246 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4033992.html
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