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Information card for entry 4036174
Preview
Coordinates | 4036174.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C18 H16 B10 N4 S2 |
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Calculated formula | C18 H16 B10 N4 S2 |
SMILES | [BH]1234[BH]567[BH]89%10[C]36%11(c3ccc(s3)C=C(C#N)C#N)[BH]364[BH]4%122[BH]215[BH]15%12[BH]%128([BH]341[C]%106%11%12c1ccc(C=C(C#N)C#N)s1)[BH]7925 |
Title of publication | Electronic Alteration on Oligothiophenes by o-Carborane: Electron Acceptor Character of o-Carborane in Oligothiophene Frameworks with Dicyano-Vinyl End-On Group. |
Authors of publication | Kim, So-Yoen; Lee, Ah-Rang; Jin, Guo Fan; Cho, Yang-Jin; Son, Ho-Jin; Han, Won-Sik; Kang, Sang Ook |
Journal of publication | The Journal of organic chemistry |
Year of publication | 2015 |
Journal volume | 80 |
Journal issue | 9 |
Pages of publication | 4573 - 4580 |
a | 15.986 ± 0.008 Å |
b | 11.333 ± 0.006 Å |
c | 14.165 ± 0.007 Å |
α | 90° |
β | 114.529 ± 0.008° |
γ | 90° |
Cell volume | 2335 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1313 |
Residual factor for significantly intense reflections | 0.0932 |
Weighted residual factors for significantly intense reflections | 0.2462 |
Weighted residual factors for all reflections included in the refinement | 0.2616 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.184 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4036174.html
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Users of the data should acknowledge the original authors of the
structural data.