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Information card for entry 4038987
Preview
| Coordinates | 4038987.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | R2TeI2 |
|---|---|
| Chemical name | bis(2,3,5,6-tetramethylphenyl)tellurium di-iodine |
| Formula | C20 H26 I2 Te |
| Calculated formula | C20 H26 I2 Te |
| SMILES | [I]([Te](c1c(c(cc(c1C)C)C)C)c1c(c(cc(c1C)C)C)C)I |
| Title of publication | Synthesis and structural features of new aryltellurenyl iodides |
| Authors of publication | Faoro, Eliandro; de Oliveira, Gelson Manzoni; Lang, Ernesto Schulz; Pereira, Cesar Bicca |
| Journal of publication | Journal of Organometallic Chemistry |
| Year of publication | 2010 |
| Journal volume | 695 |
| Journal issue | 10-11 |
| Pages of publication | 1480 - 1486 |
| a | 9.9186 ± 0.0003 Å |
| b | 14.906 ± 0.0004 Å |
| c | 14.3917 ± 0.0004 Å |
| α | 90° |
| β | 95.257 ± 0.002° |
| γ | 90° |
| Cell volume | 2118.81 ± 0.1 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0516 |
| Residual factor for significantly intense reflections | 0.0367 |
| Weighted residual factors for significantly intense reflections | 0.0822 |
| Weighted residual factors for all reflections included in the refinement | 0.0872 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.959 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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