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Information card for entry 4063201
Preview
Coordinates | 4063201.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H64 N4 Na2 O4 Yb |
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Calculated formula | C58 H64 N4 Na2 O4 Yb |
SMILES | [Yb]123456789%10([N]%11%12[Na]([O]%17CCCC%17)([O]%17CCCC%17)[N]%171[CH]3=[CH]4[CH]5=[C]6%17C(C%12=CC=C%11)(c1ccccc1)c1ccccc1)[N]13[Na]([O]%12CCCC%12)([O]%12CCCC%12)N%122[CH]7=[CH]8[CH]9=[C]%10%12C(C3=CC=C1)(c1ccccc1)c1ccccc1 |
Title of publication | Monomeric and Octameric Divalent Ytterbium Complexes of Diphenylmethyl Dipyrrolyl Dianion |
Authors of publication | Tiffany Dube; Dominique Freckmann; Sabrina Conoci; Sandro Gambarotta; Glenn P. A. Yap |
Journal of publication | Organometallics |
Year of publication | 2000 |
Journal volume | 19 |
Pages of publication | 209 - 211 |
a | 10.758 ± 0.004 Å |
b | 10.987 ± 0.004 Å |
c | 24.968 ± 0.009 Å |
α | 91.809 ± 0.005° |
β | 96.237 ± 0.005° |
γ | 116.248 ± 0.005° |
Cell volume | 2621 ± 2 Å3 |
Cell temperature | 238 ± 2 K |
Ambient diffraction temperature | 238 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0722 |
Residual factor for significantly intense reflections | 0.0518 |
Weighted residual factors for significantly intense reflections | 0.1021 |
Weighted residual factors for all reflections included in the refinement | 0.1076 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4063201.html
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Users of the data should acknowledge the original authors of the
structural data.