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Information card for entry 4063774
Preview
Coordinates | 4063774.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H68 Cl4 O5 P6 Ru2 |
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Calculated formula | C39 H68 Cl4 O5 P6 Ru2 |
SMILES | C[P](C)(C)[Ru](C#[O])(/C=C/c1ccc(c2c1C(=O)c1c(C2=O)cccc1)/C=C/[Ru](C#[O])(Cl)([P](C)(C)C)([P](C)(C)C)[P](C)(C)C)(Cl)([P](C)(C)C)[P](C)(C)C.C(Cl)Cl.O |
Title of publication | Synthesis, Characterization, and Electrochemical Properties of Diruthenium Complexes Bridged by Anthraquinones |
Authors of publication | Li, Fei; Cheng, Jie; Chai, Xiaohong; Jin, Shan; Wu, Xianghua; Yu, Guang-Ao; Liu, Sheng Hua; Chen, George Z. |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 7 |
Pages of publication | 1830 |
a | 17.893 ± 0.0009 Å |
b | 17.5966 ± 0.0008 Å |
c | 18.3564 ± 0.0009 Å |
α | 90° |
β | 109.04 ± 0.01° |
γ | 90° |
Cell volume | 5463.4 ± 0.6 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0855 |
Residual factor for significantly intense reflections | 0.0636 |
Weighted residual factors for significantly intense reflections | 0.1412 |
Weighted residual factors for all reflections included in the refinement | 0.1519 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.127 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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