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Information card for entry 4064027
Preview
Coordinates | 4064027.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | COMPOUND 1 |
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Formula | C54 H46 Ge4 |
Calculated formula | C54 H46 Ge4 |
SMILES | c1(ccccc1)[Ge](c1ccccc1)(c1ccccc1)[GeH]([Ge](c1ccccc1)(c1ccccc1)c1ccccc1)[Ge](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Syntheses, Structures, and Electronic Properties of the Branched Oligogermanes (Ph3Ge)3GeH and (Ph3Ge)3GeX (X = Cl, Br, I)† |
Authors of publication | Samanamu, Christian R.; Amadoruge, Monika L.; Yoder, Claude H.; Golen, James A.; Moore, Curtis E.; Rheingold, Arnold L.; Materer, Nicholas F.; Weinert, Charles S. |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 5 |
Pages of publication | 1046 |
a | 17.1845 ± 0.0005 Å |
b | 11.2369 ± 0.0003 Å |
c | 24.8346 ± 0.0007 Å |
α | 90° |
β | 108.38 ± 0.002° |
γ | 90° |
Cell volume | 4550.9 ± 0.2 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0432 |
Residual factor for significantly intense reflections | 0.0307 |
Weighted residual factors for significantly intense reflections | 0.0721 |
Weighted residual factors for all reflections included in the refinement | 0.0771 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4064027.html
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