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Information card for entry 4064214
Preview
| Coordinates | 4064214.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H44 Cl O8 Os P Sn |
|---|---|
| Calculated formula | C32 H44 Cl O8 Os P Sn |
| SMILES | [Os]12345(Cl)([Sn](C(=C)C(=O)OC)(C(=C)C(=O)OC)C(=C)C(=O)OC)([c]6([cH]1[cH]2[c]3([cH]4[cH]56)C)C(C)C)[P](OCC)(OCC)c1ccccc1 |
| Title of publication | Preparation of Half-Sandwich Stannyl Complexes of Osmium(II) |
| Authors of publication | Albertin, Gabriele; Antoniutti, Stefano; Castro, Jesús |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 7 |
| Pages of publication | 1914 |
| a | 10.0128 ± 0.0008 Å |
| b | 11.0162 ± 0.0009 Å |
| c | 18.3313 ± 0.0014 Å |
| α | 77.644 ± 0.001° |
| β | 87.243 ± 0.002° |
| γ | 81.271 ± 0.001° |
| Cell volume | 1952 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0553 |
| Residual factor for significantly intense reflections | 0.0468 |
| Weighted residual factors for significantly intense reflections | 0.1458 |
| Weighted residual factors for all reflections included in the refinement | 0.1549 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4064214.html
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