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Information card for entry 4064303
Preview
| Coordinates | 4064303.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H22 Ag F3 N4 O3 S |
|---|---|
| Calculated formula | C19 H22 Ag F3 N4 O3 S |
| SMILES | [Ag]1=C2N(C=CN2C)Cc2c(cc(c(c2)CN2C=1N(C=C2)C)C)C.C(F)(F)(F)S(=O)(=O)[O-] |
| Title of publication | Do Short C‒H‒M (M = Cu(I), Ag(I)) Distances Represent Agostic Interactions in Pincer-Type Complexes? Unusual NHC Transmetalation from Cu(I) to Ag(I) |
| Authors of publication | Liu, Xianghao; Pattacini, Roberto; Deglmann, Peter; Braunstein, Pierre |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 12 |
| Pages of publication | 3302 |
| a | 8.507 ± 0.002 Å |
| b | 19.316 ± 0.003 Å |
| c | 13.392 ± 0.002 Å |
| α | 90° |
| β | 91.27 ± 0.03° |
| γ | 90° |
| Cell volume | 2200 ± 0.7 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0928 |
| Residual factor for significantly intense reflections | 0.0744 |
| Weighted residual factors for significantly intense reflections | 0.1574 |
| Weighted residual factors for all reflections included in the refinement | 0.1624 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.274 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.