Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4064642
Preview
Coordinates | 4064642.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H72 Cl5 Cr2 Li N4 O2 P2 |
---|---|
Calculated formula | C48 H72 Cl5 Cr2 Li N4 O2 P2 |
SMILES | [Cr]1234([Cl][Li]56([Cl]1[Cr]1([Cl]2)([Cl]36)([Cl]5)[N](C(C)(C)C)=P(N1C(C)(C)C)(c1ccccc1)c1ccccc1)([O]1CCCC1)[O]1CCCC1)[N](C(C)(C)C)=P(N4C(C)(C)C)(c1ccccc1)c1ccccc1 |
Title of publication | Highly Active Ethylene Oligomerization Catalysts |
Authors of publication | Albahily, Khalid; Licciulli, Sebastiano; Gambarotta, Sandro; Korobkov, Ilia; Chevalier, Reynald; Schuhen, Kathrine; Duchateau, Robbert |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 12 |
Pages of publication | 3346 |
a | 12.2348 ± 0.0019 Å |
b | 12.872 ± 0.002 Å |
c | 18.296 ± 0.003 Å |
α | 71.893 ± 0.003° |
β | 85.406 ± 0.003° |
γ | 87.256 ± 0.003° |
Cell volume | 2729.1 ± 0.7 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2432 |
Residual factor for significantly intense reflections | 0.0834 |
Weighted residual factors for significantly intense reflections | 0.1786 |
Weighted residual factors for all reflections included in the refinement | 0.2527 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4064642.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.