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Information card for entry 4064697
Preview
| Coordinates | 4064697.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H94 Ge4 O4 P2 Pt |
|---|---|
| Calculated formula | C44 H75 Ge4 O4 P2 Pt |
| SMILES | [Pt]12(C(=C([Ge]([Ge]([Ge]([Ge]1(CCCC)CCCC)(CCCC)CCCC)(CCCC)CCCC)(CCCC)CCCC)C(=O)OC)C(=O)OC)[P](C)(C)CC[P]2(C)C |
| Title of publication | Chemical Properties of Tetragermaplatinacyclopentane. Insertion of an Alkyne into a Pt‒Ge Bond and Silylation Caused by H2SiPh2 |
| Authors of publication | Tanabe, Makoto; Deguchi, Takashi; Osakada, Kohtaro |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 12 |
| Pages of publication | 3386 |
| a | 20.3919 ± 0.0015 Å |
| b | 20.3919 ± 0.0015 Å |
| c | 54.171 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 22526 ± 3 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 6 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.1039 |
| Residual factor for significantly intense reflections | 0.0829 |
| Weighted residual factors for significantly intense reflections | 0.2229 |
| Weighted residual factors for all reflections included in the refinement | 0.2468 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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