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Information card for entry 4065016
Preview
| Coordinates | 4065016.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H46 Al2 Cl8 Cr N S2 Si2 |
|---|---|
| Calculated formula | C25 H46 Al2 Cl8 Cr N S2 Si2 |
| SMILES | [Cr]12(N([Si](C[S]1C1CCCCC1)(C)C)[Si](C)(C)C[S]2C1CCCCC1)([Cl][Al](Cl)(Cl)Cl)[Cl][Al](Cl)(Cl)Cl.c1(ccccc1)C |
| Title of publication | Ethylene Oligomerization Promoted by a Silylated-SNS Chromium System |
| Authors of publication | Albahily, Khalid; Gambarotta, Sandro; Duchateau, Robbert |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 17 |
| Pages of publication | 4655 |
| a | 11.0381 ± 0.0013 Å |
| b | 11.9963 ± 0.0014 Å |
| c | 31.581 ± 0.004 Å |
| α | 90° |
| β | 93.935 ± 0.002° |
| γ | 90° |
| Cell volume | 4172 ± 0.9 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0947 |
| Residual factor for significantly intense reflections | 0.0635 |
| Weighted residual factors for significantly intense reflections | 0.1541 |
| Weighted residual factors for all reflections included in the refinement | 0.171 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4065016.html
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Users of the data should acknowledge the original authors of the
structural data.