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Information card for entry 4065028
Preview
Coordinates | 4065028.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound X |
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Formula | C96 H70 P4 Ru |
Calculated formula | C96 H70 P4 Ru |
SMILES | C(#Cc1ccccc1)[Ru](C#Cc1ccccc1)([P](c1ccccc1)(C#Cc1ccccc1)c1ccccc1)([P](C#Cc1ccccc1)(c1ccccc1)c1ccccc1)([P](C#Cc1ccccc1)(c1ccccc1)c1ccccc1)[P](C#Cc1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Octahedral Alkynylphosphine Ruthenium(II) Complexes: Synthesis, Structure, and Electrochemistry |
Authors of publication | Berenguer, Jesús; Bernechea, María; Fernández, Julio; Gil, Belén; Lalinde, Elena; Moreno, M. Teresa; Ruiz, Santiago; Sánchez, Sergio |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 17 |
Pages of publication | 4665 |
a | 12.818 ± 0.0002 Å |
b | 12.818 ± 0.0002 Å |
c | 22.846 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3753.62 ± 0.1 Å3 |
Cell temperature | 223 ± 1 K |
Ambient diffraction temperature | 223 ± 1 K |
Number of distinct elements | 4 |
Space group number | 114 |
Hermann-Mauguin space group symbol | P -4 21 c |
Hall space group symbol | P -4 2n |
Residual factor for all reflections | 0.0341 |
Residual factor for significantly intense reflections | 0.0269 |
Weighted residual factors for significantly intense reflections | 0.0612 |
Weighted residual factors for all reflections included in the refinement | 0.0664 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4065028.html
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