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Information card for entry 4065120
Preview
Coordinates | 4065120.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H80 Ga4 Si2 |
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Calculated formula | C58 H80 Ga4 Si2 |
SMILES | [Ga]12(C(C)(C)C)C([Ga]3(C(C)(C)C)[H][Ga](C(C)(C)C)(C([Ga](C(C)(C)C)([H]2)[H]3)(Cc2ccccc2)[Si](c2ccccc2)(c2ccccc2)C)[H]1)(Cc1ccccc1)[Si](c1ccccc1)(c1ccccc1)C |
Title of publication | Unexpected Formation of Ga4C2H4Heteroadamantane Cages by the Reaction of Carbon-Bridged Bis(dichlorogallium) Compounds withtert-Butyllithium |
Authors of publication | Uhl, Werner; Kovert, Dirk; Zemke, Sarina; Hepp, Alexander |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 17 |
Pages of publication | 4736 |
a | 10.8708 ± 0.0003 Å |
b | 13.595 ± 0.0004 Å |
c | 21.347 ± 0.0006 Å |
α | 105.185 ± 0.0004° |
β | 96.4344 ± 0.0004° |
γ | 108.645 ± 0.0004° |
Cell volume | 2817.99 ± 0.14 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0555 |
Residual factor for significantly intense reflections | 0.0368 |
Weighted residual factors for significantly intense reflections | 0.0864 |
Weighted residual factors for all reflections included in the refinement | 0.0933 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.995 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4065120.html
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