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Information card for entry 4065217
Preview
Coordinates | 4065217.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25.5 H24 Cl Fe O3 P Pd S |
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Calculated formula | C25.5 H24 Cl Fe O3 P Pd S |
SMILES | [Pd]123([P]([c]45[cH]6[Fe]789%10%11%124([c]5(S(O1)(=O)=O)[cH]8[cH]67)[cH]1[cH]%12[cH]%11[cH]%10[cH]91)(c1ccccc1)c1ccccc1)C[CH]2=[CH2]3.C(Cl)Cl |
Title of publication | o-Diarylphosphinoferrocene Sulfonate Palladium Systems for Nonalternating Ethene‒Carbon Monoxide Copolymerization |
Authors of publication | Chen, Chao; Anselment, Timo M. J.; Fröhlich, Roland; Rieger, Bernhard; Kehr, Gerald; Erker, Gerhard |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 19 |
Pages of publication | 5248 |
a | 10.9418 ± 0.0002 Å |
b | 14.3677 ± 0.0002 Å |
c | 16.6363 ± 0.0003 Å |
α | 90.136 ± 0.001° |
β | 94.013 ± 0.001° |
γ | 108.473 ± 0.001° |
Cell volume | 2473.69 ± 0.07 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0557 |
Residual factor for significantly intense reflections | 0.0493 |
Weighted residual factors for significantly intense reflections | 0.1143 |
Weighted residual factors for all reflections included in the refinement | 0.1214 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4065217.html
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Users of the data should acknowledge the original authors of the
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