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Information card for entry 4065634
Preview
| Coordinates | 4065634.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H36 Cl3 O Si Ta |
|---|---|
| Calculated formula | C24 H36 Cl3 O Si Ta |
| SMILES | [Ta]12345(Cl)(Cl)(Cl)Oc6c([Si]([c]71[c]2([c]3([c]4([c]57C)C)C)C)(CC)CC)cc(cc6C(C)(C)C)C |
| Title of publication | Silicon-Bridged Tetramethylcyclopentadienyl−Phenoxy Complexes of Tantalum: Preparation and Alkylation of Et2Si(η5-C5Me4)(3-tBu-5-Me-2-C6H2O)TaCl3and Generation of Its Cationic Complex |
| Authors of publication | Senda, Taichi; Hanaoka, Hidenori; Oda, Yoshiaki; Tsurugi, Hayato; Mashima, Kazushi |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 9 |
| Pages of publication | 2080 |
| a | 9.6996 ± 0.0019 Å |
| b | 15.375 ± 0.003 Å |
| c | 17.381 ± 0.004 Å |
| α | 90° |
| β | 96.316 ± 0.003° |
| γ | 90° |
| Cell volume | 2576.3 ± 0.9 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0385 |
| Residual factor for significantly intense reflections | 0.0308 |
| Weighted residual factors for significantly intense reflections | 0.083 |
| Weighted residual factors for all reflections included in the refinement | 0.1014 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.243 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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