Information card for entry 4066211

Structure parameters

• Formula: C36 H51 Cl N2 P2 Pt Si Zr
• Calculated formula: C36 H51 Cl N2 P2 Pt Si Zr
• SMILES: [Pt]1([P](N([Zr](Cl)(N([P]1(c1ccccc1)c1ccccc1)C(C)C)C[Si](C)(C)C)C(C)C)(c1ccccc1)c1ccccc1)(C)C
• Title of publication: Electronic Factors Affecting Metal−Metal Interactions in Early/Late Heterobimetallics: Substituent Effects in Zirconium/Platinum Bis(phosphinoamide) Complexes†
• Authors of publication: Cooper, Benjamin G.; Fafard, Claudia M.; Foxman, Bruce M.; Thomas, Christine M.
• Journal of publication: Organometallics
• Year of publication: 2010
• Journal volume: 29
• Journal issue: 21
• Pages of publication: 5179
• a: 11.0436 ± 0.0003 Å
• b: 12.4138 ± 0.0003 Å
• c: 18.056 ± 0.0004 Å
• α: 78.704 ± 0.001°
• β: 84.254 ± 0.001°
• γ: 75.931 ± 0.001°
• Cell volume: 2351 ± 0.1 ų
• Cell temperature: 190 K
• Ambient diffraction temperature: 190 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0299
• Residual factor for significantly intense reflections: 0.0227
• Weighted residual factors for all reflections: 0.0506
• Weighted residual factors for significantly intense reflections: 0.0496
• Weighted residual factors for all reflections included in the refinement: 0.0506
• Goodness-of-fit parameter for all reflections included in the refinement: 1
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No