Information card for entry 4066253
| Formula |
C48 H58 Mg N4 P4 |
| Calculated formula |
C48 H58 Mg N4 P4 |
| SMILES |
C(C)(C)N1[Mg]2(N(C(C)C)P(c3ccccc3)N(C(C)C)[P]2(c2ccccc2)c2ccccc2)[P](c2ccccc2)(c2ccccc2)N(C(C)C)P1c1ccccc1 |
| Title of publication |
Metalation and Transmetalation Studies on Ph2PN(iPr)P(Ph)N(iPr)H for Selective Ethene Trimerization to 1-Hexene⊥ |
| Authors of publication |
Peitz, Stephan; Peulecke, Normen; Aluri, Bhaskar R.; Müller, Bernd H.; Spannenberg, Anke; Rosenthal, Uwe; Al-Hazmi, Mohammed H.; Mosa, Fuad M.; Wöhl, Anina; Müller, Wolfgang |
| Journal of publication |
Organometallics |
| Year of publication |
2010 |
| Journal volume |
29 |
| Journal issue |
21 |
| Pages of publication |
5263 |
| a |
11.2819 ± 0.0006 Å |
| b |
11.9821 ± 0.0005 Å |
| c |
19.853 ± 0.001 Å |
| α |
77.452 ± 0.004° |
| β |
86.257 ± 0.004° |
| γ |
62.376 ± 0.003° |
| Cell volume |
2319.1 ± 0.2 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0746 |
| Residual factor for significantly intense reflections |
0.0457 |
| Weighted residual factors for significantly intense reflections |
0.1295 |
| Weighted residual factors for all reflections included in the refinement |
0.135 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.007 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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