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Information card for entry 4066339
Preview
| Coordinates | 4066339.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H28 Zr |
|---|---|
| Calculated formula | C36 H28 Zr |
| SMILES | C1[C]2#[C](c3ccccc3)[Zr]34567812(C[C]3#[C]4c1ccccc1)(C[C]5#[C]6c1ccccc1)C[C]7#[C]8c1ccccc1 |
| Title of publication | Synthesis and Electronic Structure of Tetrakis(η3-phenylpropargyl)zirconium† |
| Authors of publication | Denomme, Dan R.; Dumbris, Seth M.; Hyatt, I. F. Dempsey; Abboud, Khalil A.; Ghiviriga, Ion; McElwee-White, Lisa |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 21 |
| Pages of publication | 5252 |
| a | 20.7551 ± 0.0014 Å |
| b | 8.6203 ± 0.0006 Å |
| c | 17.4685 ± 0.0011 Å |
| α | 90° |
| β | 116.041 ± 0.001° |
| γ | 90° |
| Cell volume | 2808.1 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0312 |
| Residual factor for significantly intense reflections | 0.0244 |
| Weighted residual factors for significantly intense reflections | 0.0676 |
| Weighted residual factors for all reflections included in the refinement | 0.07 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4066339.html
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Users of the data should acknowledge the original authors of the
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