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Information card for entry 4066443
Preview
Coordinates | 4066443.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | JY-98 |
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Chemical name | tilley04 |
Formula | C54 H46 Cl8 N4 Ni3 Si2 |
Calculated formula | C54 H46 Cl8 N4 Ni3 Si2 |
SMILES | c1ccc2cccc3c2[n]1[Ni]124([Si]563(c3cccc7ccc[n](c37)[Ni]3725[n]2cccc5cccc(c25)[Si]213(c1cccc3ccc[n](c13)[Ni]4672Cl)c1ccccc1)c1ccccc1)Cl.C(CCl)Cl.C(CCl)Cl.C(CCl)Cl |
Title of publication | Nickel Complexes with Bis(8-quinolyl)silyl Ligands. An Unusual Ni3Si2Cluster Containing Six-Coordinate Silicon† |
Authors of publication | Yang, Jian; Del Rosal, Iker; Fasulo, Meg; Sangtrirutnugul, Preeyanuch; Maron, Laurent; Tilley, T. Don |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 21 |
Pages of publication | 5544 |
a | 18.0662 ± 0.0011 Å |
b | 11.6179 ± 0.0007 Å |
c | 26.6833 ± 0.0017 Å |
α | 90° |
β | 104.887 ± 0.001° |
γ | 90° |
Cell volume | 5412.6 ± 0.6 Å3 |
Cell temperature | 143 ± 2 K |
Ambient diffraction temperature | 143 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0417 |
Residual factor for significantly intense reflections | 0.0335 |
Weighted residual factors for significantly intense reflections | 0.082 |
Weighted residual factors for all reflections included in the refinement | 0.0879 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4066443.html
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Users of the data should acknowledge the original authors of the
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