Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4066517
Preview
Coordinates | 4066517.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C15 H14 Br Fe N |
---|---|
Calculated formula | C15 H14 Br Fe N |
SMILES | [Fe]123456789[c]%10([cH]1[cH]2[cH]3[cH]4%10)[C@H](C)C[C@H]([c]15[cH]6[cH]7[cH]8[c]91Br)C#N.[Fe]123456789[c]%10([cH]1[cH]2[cH]3[cH]4%10)[C@@H](C)C[C@@H]([c]15[cH]6[cH]7[cH]8[c]91Br)C#N |
Title of publication | Developing a Reliable Synthetic Route tocis-1,3-Bridge-Disubstituted [3]Ferrocenophane Systems |
Authors of publication | Usener, Carolin; Kehr, Gerald; Fröhlich, Roland; Wibbeling, Birgit; Mück-Lichtenfeld, Christian; Erker, Gerhard |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 17 |
Pages of publication | 3852 |
a | 30.0908 ± 0.0007 Å |
b | 7.6044 ± 0.0002 Å |
c | 12.5316 ± 0.0003 Å |
α | 90° |
β | 112.616 ± 0.002° |
γ | 90° |
Cell volume | 2647.01 ± 0.12 Å3 |
Cell temperature | 198 ± 2 K |
Ambient diffraction temperature | 198 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1209 |
Residual factor for significantly intense reflections | 0.0893 |
Weighted residual factors for significantly intense reflections | 0.2392 |
Weighted residual factors for all reflections included in the refinement | 0.2594 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4066517.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.