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Information card for entry 4066801
Preview
| Coordinates | 4066801.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C64 H52 Ge4 Ir2 O4 |
|---|---|
| Calculated formula | C64 H52 Ge4 Ir2 O4 |
| SMILES | C([IrH]1([Ge](c2ccccc2)(c2ccccc2)[IrH](C#[O])(C#[O])([Ge]1(c1ccccc1)c1ccccc1)[Ge](c1ccccc1)(c1ccccc1)c1ccccc1)([Ge](c1ccccc1)(c1ccccc1)c1ccccc1)C#[O])#[O] |
| Title of publication | Iridium−Germanium and −Tin Carbonyl Complexes |
| Authors of publication | Adams, Richard D.; Trufan, Eszter |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 19 |
| Pages of publication | 4346 |
| a | 9.9572 ± 0.0009 Å |
| b | 11.2423 ± 0.001 Å |
| c | 13.4482 ± 0.0012 Å |
| α | 76.579 ± 0.002° |
| β | 74.859 ± 0.002° |
| γ | 87.433 ± 0.002° |
| Cell volume | 1413.3 ± 0.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0573 |
| Residual factor for significantly intense reflections | 0.0455 |
| Weighted residual factors for significantly intense reflections | 0.1031 |
| Weighted residual factors for all reflections included in the refinement | 0.1081 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.125 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4066801.html
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Users of the data should acknowledge the original authors of the
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