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Information card for entry 4066814
Preview
| Coordinates | 4066814.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C58 H76 N3 Nb O4 Si |
|---|---|
| Calculated formula | C58 H76 N3 Nb O4 Si |
| SMILES | [Nb]12(=Nc3c(cccc3C(C)C)C(C)C)([N](=C(c3c1c1OCOc1cc3)C)c1c(cccc1C(C)C)C(C)C)([N](=C(c1c2c2OCOc2cc1)C)c1c(cccc1C(C)C)C(C)C)C[Si](C)(C)C |
| Title of publication | Derivatization of Niobium Complexes Bearing Imido and Acetophenone Imine Ligands |
| Authors of publication | Neshat, Abdollah; Schmidt, Joseph A. R. |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 23 |
| Pages of publication | 6219 |
| a | 16.7568 ± 0.0007 Å |
| b | 15.699 ± 0.0007 Å |
| c | 19.9852 ± 0.0008 Å |
| α | 90° |
| β | 90.373 ± 0.001° |
| γ | 90° |
| Cell volume | 5257.3 ± 0.4 Å3 |
| Cell temperature | 140 ± 2 K |
| Ambient diffraction temperature | 140 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0945 |
| Residual factor for significantly intense reflections | 0.0811 |
| Weighted residual factors for significantly intense reflections | 0.2238 |
| Weighted residual factors for all reflections included in the refinement | 0.2329 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.173 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4066814.html
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Users of the data should acknowledge the original authors of the
structural data.