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Information card for entry 4066854
Preview
Coordinates | 4066854.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H20 Mn4 N O12 Se5 |
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Calculated formula | C20 H20 Mn4 N O12 Se5 |
SMILES | [Se]12[Se]3[Mn]4([Se]5[Se]4[Mn]3([Se]3[Mn]41([Mn]253(C4=O)(C#[O])C#[O])(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O].[N+](CC)(CC)(CC)CC |
Title of publication | Selenium−Manganese Carbonyl Clusters: Synthesis, Reversible Transformation, Electrochemical Properties, and Theoretical Calculations |
Authors of publication | Ho, Chia-Hua; Chu, Yen-Yi; Lin, Chien-Nan; Chen, Horng-Wen; Huang, Chung-Yi; Shieh, Minghuey |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 19 |
Pages of publication | 4396 |
a | 35.472 ± 0.0008 Å |
b | 11.5808 ± 0.0003 Å |
c | 20.6387 ± 0.0006 Å |
α | 90° |
β | 104.652 ± 0.001° |
γ | 90° |
Cell volume | 8202.5 ± 0.4 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0876 |
Residual factor for significantly intense reflections | 0.0659 |
Weighted residual factors for significantly intense reflections | 0.1694 |
Weighted residual factors for all reflections included in the refinement | 0.1854 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.999 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4066854.html
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