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Information card for entry 4066908
Preview
Coordinates | 4066908.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [trans-(trimethylsilylethynyl)bis{1,2-bis(diphenylphosphino)ethane}carbonyltungsten] |
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Formula | C58 H57 O P4 Si W |
Calculated formula | C58 H57 O P4 Si W |
SMILES | [W]12([P](CC[P]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)([P](CC[P]2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(C#[O])C#C[Si](C)(C)C |
Title of publication | [W(CO)(dppe)2] Cumulenylidene and Acetylide Complexes Accessed via Stannylated Acetylenes and Butadiynes |
Authors of publication | Semenov, Sergey N.; Blacque, Olivier; Fox, Thomas; Venkatesan, Koushik; Berke, Heinz |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 23 |
Pages of publication | 6321 |
a | 11.6878 ± 0.0002 Å |
b | 12.7924 ± 0.0001 Å |
c | 17.6224 ± 0.0003 Å |
α | 87.9673 ± 0.0013° |
β | 78.0232 ± 0.0016° |
γ | 76.5809 ± 0.0013° |
Cell volume | 2506.87 ± 0.07 Å3 |
Cell temperature | 183 ± 2 K |
Ambient diffraction temperature | 183 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0403 |
Residual factor for significantly intense reflections | 0.0307 |
Weighted residual factors for significantly intense reflections | 0.0772 |
Weighted residual factors for all reflections included in the refinement | 0.0791 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4066908.html
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Users of the data should acknowledge the original authors of the
structural data.