Information card for entry 4067226

Structure parameters

• Formula: C4 H14 K N Si2
• Calculated formula: C4 H14 K N Si2
• SMILES: C[SiH]([N-][SiH](C)C)C.[K+]
• Title of publication: Bis(dimethylsilyl)amide Complexes of the Alkaline-Earth Metals Stabilized by β-Si−H Agostic Interactions: Synthesis, Characterization, and Catalytic Activity
• Authors of publication: Sarazin, Yann; Roşca, Dragoş; Poirier, Valentin; Roisnel, Thierry; Silvestru, Anca; Maron, Laurent; Carpentier, Jean-François
• Journal of publication: Organometallics
• Year of publication: 2010
• Journal volume: 29
• Journal issue: 23
• Pages of publication: 6569
• a: 5.8129 ± 0.0009 Å
• b: 11.2427 ± 0.0019 Å
• c: 14.979 ± 0.002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 978.9 ± 0.3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 62
• Hermann-Mauguin space group symbol: P n a m
• Hall space group symbol: -P 2c 2n
• Residual factor for all reflections: 0.0394
• Residual factor for significantly intense reflections: 0.0327
• Weighted residual factors for significantly intense reflections: 0.0791
• Weighted residual factors for all reflections included in the refinement: 0.0822
• Goodness-of-fit parameter for all reflections included in the refinement: 1.071
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No