Information card for entry 4067368

Structure parameters

• Chemical name: tetrakis(o-methoxyphenyl)germane
• Formula: C28 H28 Ge O4
• Calculated formula: C28 H28 Ge O4
• SMILES: [Ge](c1ccccc1OC)(c1ccccc1OC)(c1ccccc1OC)c1ccccc1OC
• Title of publication: Use of73Ge NMR Spectroscopy and X-ray Crystallography for the Study of Electronic Interactions in Substituted Tetrakis(phenyl)-, -(phenoxy)-, and -(thiophenoxy)germanes
• Authors of publication: Yoder, Claude H.; Agee, Tamara M.; Griffith, Allison K.; Schaeffer, Charles D.; Carroll, Mary J.; DeToma, Alaina S.; Fleisher, Adam J.; Gettel, Cameron J.; Rheingold, Arnold L.
• Journal of publication: Organometallics
• Year of publication: 2010
• Journal volume: 29
• Journal issue: 3
• Pages of publication: 582
• a: 8.5326 ± 0.0009 Å
• b: 8.8304 ± 0.0009 Å
• c: 16.6832 ± 0.0016 Å
• α: 80.629 ± 0.001°
• β: 82.178 ± 0.001°
• γ: 89.63 ± 0.001°
• Cell volume: 1228.5 ± 0.2 ų
• Cell temperature: 208 ± 2 K
• Ambient diffraction temperature: 208 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0535
• Residual factor for significantly intense reflections: 0.0361
• Weighted residual factors for significantly intense reflections: 0.0806
• Weighted residual factors for all reflections included in the refinement: 0.089
• Goodness-of-fit parameter for all reflections included in the refinement: 0.992
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No