Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4067569
Preview
| Coordinates | 4067569.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H24 N2 O2 W |
|---|---|
| Calculated formula | C16 H24 N2 O2 W |
| SMILES | [W]1234(C#[N]C(C)(C)C)(C#[O])([c]5([c]1([c]2([c]3([c]45C)C)C)C)C)N=O |
| Title of publication | Ground-State Electronic Asymmetry in Cp*W(NO)(η1-isonitrile)2Complexes |
| Authors of publication | Semproni, Scott P.; McNeil, W. Stephen; Baillie, Rhett A.; Patrick, Brian O.; Campana, Charles F.; Legzdins, Peter |
| Journal of publication | Organometallics |
| Year of publication | 2010 |
| Journal volume | 29 |
| Journal issue | 4 |
| Pages of publication | 867 |
| a | 9.2164 ± 0.0004 Å |
| b | 17.4223 ± 0.0009 Å |
| c | 11.4165 ± 0.0005 Å |
| α | 90° |
| β | 106.903 ± 0.002° |
| γ | 90° |
| Cell volume | 1753.96 ± 0.14 Å3 |
| Cell temperature | 103 ± 2 K |
| Ambient diffraction temperature | 103 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0242 |
| Residual factor for significantly intense reflections | 0.0209 |
| Weighted residual factors for significantly intense reflections | 0.0505 |
| Weighted residual factors for all reflections included in the refinement | 0.0519 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4067569.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.