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Information card for entry 4067569
Preview
Coordinates | 4067569.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H24 N2 O2 W |
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Calculated formula | C16 H24 N2 O2 W |
SMILES | [W]1234(C#[N]C(C)(C)C)(C#[O])([c]5([c]1([c]2([c]3([c]45C)C)C)C)C)N=O |
Title of publication | Ground-State Electronic Asymmetry in Cp*W(NO)(η1-isonitrile)2Complexes |
Authors of publication | Semproni, Scott P.; McNeil, W. Stephen; Baillie, Rhett A.; Patrick, Brian O.; Campana, Charles F.; Legzdins, Peter |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 4 |
Pages of publication | 867 |
a | 9.2164 ± 0.0004 Å |
b | 17.4223 ± 0.0009 Å |
c | 11.4165 ± 0.0005 Å |
α | 90° |
β | 106.903 ± 0.002° |
γ | 90° |
Cell volume | 1753.96 ± 0.14 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0242 |
Residual factor for significantly intense reflections | 0.0209 |
Weighted residual factors for significantly intense reflections | 0.0505 |
Weighted residual factors for all reflections included in the refinement | 0.0519 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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