Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4067734
Preview
Coordinates | 4067734.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H114 Si20 |
---|---|
Calculated formula | C38 H114 Si20 |
SMILES | C[Si]1([Si](C)(C)[Si](C)([Si](C)([Si](C)(C)[Si]1(C)C)C)C)[Si]([Si](C)(C)[Si](C)(C)[Si]([Si]1(C)[Si](C)(C)[Si](C)(C)[Si](C)(C)[Si](C)(C)[Si]1(C)C)([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Cyclic and Bicyclic Methylpolysilanes and Some Oligosilanylene-Bridged Derivatives |
Authors of publication | Wallner, Andreas; Hlina, Johann; Konopa, Tina; Wagner, Harald; Baumgartner, Judith; Marschner, Christoph; Flörke, Ulrich |
Journal of publication | Organometallics |
Year of publication | 2010 |
Journal volume | 29 |
Journal issue | 12 |
Pages of publication | 2660 |
a | 9.946 ± 0.002 Å |
b | 13.658 ± 0.003 Å |
c | 15.241 ± 0.003 Å |
α | 105.86 ± 0.03° |
β | 99.83 ± 0.03° |
γ | 111 ± 0.03° |
Cell volume | 1774.1 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.146 |
Residual factor for significantly intense reflections | 0.0812 |
Weighted residual factors for significantly intense reflections | 0.1537 |
Weighted residual factors for all reflections included in the refinement | 0.1752 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.963 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4067734.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.